China Mechanical Engineering ›› 2011, Vol. 22 ›› Issue (3): 257-261,273.

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Reliability Statistical Model Verification of Aerospace Electrical Connectors under Multiple Stresses

Qian Ping1,2;Chen Wenhua2;Gao Liang1;Lu Xianbiao3;Ma Zikui1
  

  1. 1.State Key Laboratory of Fluid Power Transmission and Control, Zhejiang University, Hangzhou, 310027
    2.Zhejiang Sci-Tech University, Hangzhou, 310018
    3.Hangzhou Aerospace Electrical Technology Co. Ltd., Hangzhou, 310015
  • Online:2011-02-10 Published:2011-03-02
  • Supported by:
     
    National Natural Science Foundation of China(No. 50745040,50935002);
    National High-tech R&D Program of China (863 Program) (No. 2007AA04Z409);
    Zhejiang Provincial Natural Science Foundation of China(No. Y1100777)

航天电连接器综合应力可靠性统计模型的验证

钱萍1,2;陈文华2;高亮1;卢献彪3;马子魁1
  

  1. 1.浙江大学流体传动与控制国家重点实验室,杭州,310027
    2.浙江理工大学,杭州,310018
    3.中国航天科技集团公司九院八二五厂,杭州,310015
  • 基金资助:
    国家自然科学基金资助项目(50745040,50935002);国家高技术研究发展计划(863计划)资助项目(2007AA04Z409);民用航天科技预研资助项目(B1220062302);浙江省自然科学基金资助项目(Y1100777);浙江理工大学科研启动基金资助项目(1003809-Y) 
    National Natural Science Foundation of China(No. 50745040,50935002);
    National High-tech R&D Program of China (863 Program) (No. 2007AA04Z409);
    Zhejiang Provincial Natural Science Foundation of China(No. Y1100777)

Abstract:

For problems of reliability statistical model’s accuracy, aiming at verifying the generalized Eyring-Weibull model of electrical connectors under multiple stresses derived from failure mechanism, from the statistical test point of view, based on the constant accelerated life test under multiple stresses, by using the probability graph and Van-Montfort methods, the failure life distribution of electrical connectors was verified that it followed Weibull distribution; by regression analysis, the accelerated life equation of electrical connectors was validated to be generalized Eyring model. The results provide a powerful evidence for that the reliability statistical model of Y11P series electrical connectors derived from failure mechanism can preferably describe its life characteristics.

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摘要:

针对目前普遍存在的可靠性统计模型准确性的问题,依据从失效机理推导出的电连接器综合应力作用下的广义Eyring-Weibull模型,从统计检验角度出发,利用恒定综合应力加速寿命试验数据,应用概率纸检验法及范-蒙特福特检验法,验证了电连接器的寿命服从威布尔分布;利用图分析和回归分析,验证了航天电连接器的加速寿命方程为广义Eyring模型。验证结果表明,广义Eyring-Weibull模型能较好地描述Y11P系列电连接器寿命特征在综合应力作用下的变化规律。

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