[1]常素萍,谢铁邦.基于白光干涉的MEMS三维表面形貌测量[J].华中科技大学学报:自然科学版,2007,35(9):8-11.
[2]Sandoz P, Tribillon G, Perrin H. High-resolution Profilometry by Using rithms for Spectroscopic Phase Calculation Algo-Analysis o{ White-light Interferograms[J]. Journal o Modern Optics, 1996,43(4) :701-708.
[3]曲芳,钟金钢.数字相移技术用于不连续复杂物体的三维面形测量[J].光学技术,2004,30(4):478-480.
[4]Dresel T, Husler G, Venzke H. Three-dimensional Sensing of Rough Surfaces by Coherence Radar[J]. Applied Optics,1992,31(7): 919-925.
[5]Balasubramanian N, Calif L S. Optical System for Surface Topography Measurement: US, 4340306[P]. 1982-02-04.
[6]李朝辉,井文才,周革,等.相移干涉三维形貌纳米检测及算法研究[J].纳米技术与精密工程,2004,2(3):217-220.
[7]戴蓉.基于垂直扫描工作台的白光干涉表面形貌测量系统研究[D].华中科技大学;华中科技大学,2007:
[8]王淑珍,谢铁邦,常素萍.复合型超精密表面形貌测量仪[J].光学精密工程,2011,19(4):828-835.
[9]Han G, Kim S. Numerical Correction of Reference Phases in Phase-shifting Interferometry by Iterative Least-squares Fitting[J]. Applied Optics, 1994,33 (31) :7321-7325.
[10]Phillion D. General Methods for Generating Phase- shifting Interferometry Algorithms[J]. Applied Optics,1997,36(31) :8098-8115.
[11]吴栋,朱日宏,陈磊.移相式激光干涉仪抗振技术的研究进展[J].激光与光电子学进展,2004,41(6):25-29.
[12]赵智亮,夏伯才,陈立华,等.相移干涉测量中相移误差的自修正[J].光学精密工程,2013,21(5):1116-1121.
[13]Martin H, Wang K, Jiang X. Vibration Compensating Beam Scanning Interferometer for Surface Measurement[J]. Applied Optics, 2008, 47 (7) .. 888- 893.
[14]Kinoshita M,Takeda M, Yago H. Optical Frequen- cy-domain Imaging Microprofilometry with a Frequency-tunable Liquid-crystal Fabry-perot Etalon Device[J]. Applied Optics, 1999, 38 (34) : 7063- 7068.
[15]Wang K,Cao Y. Performance Comparison of Opti- cal Path Difference Calculation Algorithms for Wavelength Scanning Interferometry[J]. Proc. of SPIE, 2010,7656 : 76560V-1-76560V-8.
[16]何向同.基于相移干涉的mems变形镜平面度测试系统误差分析与校正 [D].中国科学技术大学,2009: |