[1]Nair V N. Discussion: Estimation of Reliability in Field Performance Sutdies[ J ]. Technometrics, 1988,30(4) : 379-383.
[2]姚增起.系统退化和系统可靠性研究[D].北京:中国科学院自动化研究所,1988.
[3]Carey M B, Koenig R H. Reliability Assessment Based on Accelerated Degradation[J]. IEEE Trans- actions on Reliability, 1991,40 (5): 499-506.
[4]Meeker W Q, Hamada M. Statistical Tools of the Rapid Development & Evaluation of High--relia- bility Products[J]. IEEE Transactions on Reliabili- ty,1995,44(2) :187-198.
[5]Sun Quan, Zhou Jinglun, Zhong Zheng, et al. Guass-- Poisson Joint Distribution Model for Degradation Failure [J]. IEEE Transactions on Reliability, 2004,32(5) : 1864-1868.
[6]Huang Wei, Duane L. An Alternative Degradation Reliabilily Modeling Approach Using Mxaimun Likelihood Estimation [J]. IEEE Transactions on Reliability, 2005,54(2) :310-317.
[7]李晓阳[1],姜同敏[1],黄涛[2],李庚雨[2].微波电子产品贮存状态的SSADT评估方法[J].北京航空航天大学学报,2008,34(10):1135-1138.
[8]钟强晖[1],张志华[2],吴和声[3].基于退化数据的可靠性评估方法探讨[J].系统工程与电子技术,2009(9):2280-2284.
[9]Yang Guangbin. Reliability Demonstration through Degradation Bogey Testing[J]. IEEE Transactions on Reliability,2009,58(4) :604-610.
[10]陈文华[1],李平真[2].航天电连接器的可靠性数学模型[J].航空学报,1997,18(6):732-734.
[11]陈文华 [1],崔杰 [2],潘骏 [3],周升俊 [4],卢献彪 [4].威布尔分布下失效率的Bayes验证试验方法[J].机械工程学报,2005,41(12):118-121.
[12]陈文华[1],李红石[1],连文志[1],潘骏[2],卢献彪[3].航天电连接器环境综合应力加速寿命试验与统计分析[J].浙江大学学报:工学版,2006,40(2):348-351.
[13]程礼椿.电接触理论及应用[M].北京:机械工业出版社,1988. |