J4 ›› 201016, Vol. 21 ›› Issue (16): 1936-1940.
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Liu Anping1;Liu Jichun2
Online:
Published:
刘安平1;刘济春2
Abstract:
Key words: atomic force microscope(AFM), nano-detection, lens structure, swatch scanning
摘要:
关键词: 原子力显微镜;纳米检测;镜体结构;样本扫描
CLC Number:
TH742.9
TN16
LIU An-Beng, LIU Ji-Chun.
刘安平, 刘济春.
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