[1]Woodall W H, Spitzner D J, Montgomery D C, et al. Using Control Charts to Monitor Process and Product Quality Profiles[J]. Journal of Quality Technology, 2004, 36(3): 309-320.
[2]Hawkins D M, Peihua Q, Chang W K. The Changepoint Model for Statistical Process Control[J]. Journal of Quality Technology, 2003, 35(4): 355-366.
[3]Koh C K H, Shi J, Black J M, et al. Tonnage Signature Attribute Analysis for Stamping Process[J]. Transactions—North American Manufacturing Research Institution of SME, 1996, 24: 193-198.
[4]Walker E, Wright S P. Comparing Curves Using Additive Models[J]. Journal of Quality Technology, 2002, 34(1): 118-129.
[5]Tracy N D. Multivariate Control Charts for Individual Observations[J]. Journal of Quality Technology, 1992, 24(2): 88-95.
[6]Kang L, Albin S. On-line Monitoring When the Process Yields a Linear Profile[J]. Journal of Quality Technology, 2000, 32(4): 418-426.
[7]Nagappan N, Williams L, Vouk M, et al. Using In-process Testing Metrics to Estimate Post-release Field Quality[C]// ISSRE07. The 18th IEEE International Symposium on Software Reliability, 2007. Trollhattan: IEEE, 2007: 209-214.
[8]Zhang H, Albin S. Detecting Outliers in Complex Profiles Using a χ2 Control Chart Method[J]. IIE Transactions, 2009, 41(4): 335-345.
[9]Chang S I, Yadama S. Statistical Process Control for Monitoring Non-linear Profiles Using Wavelet Filtering and B-spline Approximation[J]. International Journal of Production Research, 2010, 48(4): 1049-1068.
[10]Girimurugan S, Chicken E, Pignatiello Jr J J, et al. Wavelet Anova for Detection of Local and Global Profile Changes[C]//Proceedings of the 2013 Industrial and Systems Engineering Research Conference. San Juan, Puerto Rico:IIE. 2013: 3235-3244.
[11]Ding Y, Zeng L, Zhou S. Phase I Analysis for Monitoring Nonlinear Profiles in Manufacturing Processes[J]. Journal of Quality Technology, 2006, 38(3): 199-216.
[12]Colosimo B M, Pacella M. On the Use of Principal Component Analysis to Identify Systematic Patterns in Roundness Profiles[J]. Quality and Reliability Engineering International, 2007, 23(6): 707-725.
[13]Shiau J J H, Huang H L, Lin S H, et al. Monitoring Nonlinear Profiles with Random Effects by Nonparametric Regression[J]. Communications in Statistics—Theory and Methods, 2009, 38(10): 1664-1679.
[14]Lee J A, Verleysen M. Nonlinear Dimensionality Reduction[M]. New York: Springer Science & Business Media, 2007.
[15]Neto F M, de Magalhes M S. A Laplacian Spectral Method in Phase I Analysis of Profiles[J]. Applied Stochastic Models in Business and Industry, 2012, 28(3): 251-263.
[16]Tenenbaum J B, de Silva V, Langford J C. A Global Geometric Framework for Nonlinear Dimensionality Reduction[J]. Science, 2000, 290(5500): 2319-2323.
[17]Mardia K V, Kent J T, Bibby J M. Multivariate Analysis [M]. London: Academic Press, 1979.
[18]Samko O, Marshall A D, Rosin P L. Selection of the Optimal Parameter Value for the Isomap Algorithm[J]. Pattern Recognition Letters, 2006, 27(9): 968-979.
|