中国机械工程 ›› 2015, Vol. 26 ›› Issue (6): 733-736,742.

• 机械基础工程 • 上一篇    下一篇

光刻旋涂中的膜厚分析与数值模拟

刘学平1;郑钢1,2   

  1. 1.清华大学深圳研究生院,深圳,518055
    2.清华大学,北京,100084
  • 出版日期:2015-03-25 发布日期:2015-03-24
  • 基金资助:
    国家科技重大专项(2012ZX02102)

Analysis and Numerical Simulation of Film Thickness of Photoresist Spin Coating

Liu Xueping1;Zheng  Gang1,2   

  1. 1.Graduate School of Tsinghua University at Shenzhen,Shenzhen,Guangdong,518055
    2.Tsinghua University,Beijing,100084
  • Online:2015-03-25 Published:2015-03-24
  • Supported by:
    National Science and Technology Major Project ( No. 2012ZX02102)

摘要:

旋涂法是光刻工艺中涂胶的重要方法,在旋涂经典EBP方程和考虑挥发与转速关系的溶剂挥发模型基础上,通过数值模拟对溶剂挥发模型提出的过渡点增加了动态参数因子补偿,得出更合理的膜厚拟合方程。通过自制的旋涂验证装置进行光刻涂胶实验并采集相关实验数据来验证拟合方程的正确性。利用该优化的拟合方法来指导实践,可制定更为合理的实际工艺参数。

关键词: 旋涂, 动态补偿因子, 溶剂挥发, 膜厚

Abstract:

The spin coating method was an important method for photoresist coating in the photolithography process. Based on the mode of the classical EBP equation and solvent evaporation mode which considered the relationship between the solvent evaporation and spin speed, and the dynamic parameter compensation was added through the numerical simulation of the transition point to get a further modified equation. The validity of the modified equation was verified by the experimental data collected by the lab made spin coating device. More reasonable process parameters can be obtained with this optimized fitting method.

Key words: spin , coating;dynamic compensation factor;solvent evaporation;film thickness

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